News & Events

Get to know XwinSys upcoming new & events

    5 seconds Shot for full feature parameters, The Multi-Stack Application for bumps, Accurate and repeatable results
    Keep the tool calibrated and stable so that all measurement recipes will yield consistent results over a long period of time.
    April 25-27, 2017 SPICE Arena, Penang - Malaysia
    SEMICON West 2016 has started.
    Unique In-line and non-destructive hybrid technology – a new standard for the semiconductor industry
    Patented Hybrid In-Line Metrology System to be Featured
    United States Patent Office Grants Process Patent
    NMT: Noise-reduced Multilayer Thin-film Measurement System a Revolutionary Tool
    Wonderful Holday Season & Happy New Year