Welcome To XwinSys Technology Development Ltd.

MINIXwinSys is dedicated to the design, manufacture and marketing of novel solutions based on improved X-ray technology combined with automated optical 3D & 2D microscopes, for the Semiconductor and related industries.  


The XwinSys product line was designed to offer an attractive and innovative technological solution to the rapid-growing semiconductors market, allowing multiple application capabilities, modular technological concept, cost-effective maintenance and budget oriented approach.


Integrated and improved X-Ray and optical (3D & 2D) analysis is a new approach to meet the challenges of roadmap requirements for inspection and metrology of 3D structures in the Semiconductor industry.


3D-IC is the fastest growing segment of the Semiconductor industry and leads the way to vertical stacking that is evolving as the disruptive force of the industry.


XwinSys has recently launched its unique NMT technology - Noise-reduced, Multilayer, Thin-film measurements, for metrology of localized ultra-thin layers and features.

 

 



News & Events

  • Visit us SemiconWest2016

    Visit us SemiconWest2016

    Eurocontrol’s XwinSys at SEMICON West 2016

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  • NewsEvents

    NewsEvents

    Eurocontrol’s XwinSys Receives United States Patent

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  • NewsEvents

    NewsEvents

    Eurocontrol’s Xenemetrix at Analytica 2016 Munich

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  • NewsEvents

    NewsEvents

    Eurocontrol’s Xenemetrix Announces MOU with Netafim for Entry into the Precision Agriculture Industry

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  • NewsEvents

    NewsEvents

    NMT: Noise-reduced Multilayer Thin-film Measurement System a Revolutionary Tool

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