Welcome To XwinSys Technology Development Ltd.
XwinSys is dedicated to the design, manufacture and marketing of novel solutions based on improved X-ray technology combined with automated optical 3D & 2D microscopes, for the Semiconductor and related industries.
The XwinSys product line was designed to offer an attractive and innovative technological solution to the rapid-growing semiconductors market, allowing multiple application capabilities, modular technological concept, cost-effective maintenance and budget oriented approach.
Integrated and improved X-Ray and optical (3D & 2D) analysis is a new approach to meet the challenges of roadmap requirements for inspection and metrology of 3D structures in the Semiconductor industry.
3D-IC is the fastest growing segment of the Semiconductor industry and leads the way to vertical stacking that is evolving as the disruptive force of the industry.
XwinSys has recently launched its unique NMT technology - Noise-reduced, Multilayer, Thin-film measurements, for metrology of localized ultra-thin layers and features.